Large-Scale Integrated Circuit Testing -- Digital, Memory, and Mixed-Signal Systems

Author: (USA) Bushnell, M.L. et al. (), Jiang Anping et al. (Translation)
Publisher:
Publish Date: 2005-08-01
Features: VLSI testing includes digital, memory, and mixed-signal circuit testing. This book systematically introduces the testing and testability design of these three types of circuits. The book is divided into three parts. Part I is Testing Fundamentals, which introduces basic testing concepts, testing equipment, testing economics, and fault models. Part II is Testing Methods, which elaborates in detail on test generation for combinational and sequential circuits, memory testing, DSP-based and model-based analog and mixed-signal testing, delay testing, and IDDQ testing, among others. Part III is Testability Design, including scan design, BIST, boundary scan testing, analog test bus standards, and SOC testing based on IP cores. This book can serve as a textbook and reference for senior undergraduate and graduate students in computer science, microelectronics, electronic engineering, radio and automatic control, and signal processing. It is also suitable for researchers working in these fields and is particularly ideal for engineering technicians engaged in VLSI circuit design and testing.