Analysis and Self-Testing Questions of Basic Analog Electronic Technology

Author: Zhang Yumin
Publisher:
Publish Date: 2003-06-01
Features: This book is divided into two parts: Part I Typical Problem Analysis includes three modules: summarization of main content and basic concepts, analysis of typical problems, and practice exercises; Part II Self-Test Questions includes eight sets of questions for college and university graduates, as well as postgraduate entrance examination papers. An appendix is provided at the end of the book, offering reference answers to exercises and self-test questions from each chapter. The examples selected in the book are highly representative.