Electronic System Small-Sample Test Theory and Methods

Author: Wang Guoyu Shen Xujian
Publisher:
Publish Date: 2003-04-01
Features: This book provides a detailed introduction and elaboration on the theory of Bayes small-sample methods and its application in electronic system testing. Due to the advanced nature of the Bayes method, its rationality in interpreting test results and ease of operation make it possible to significantly reduce the required sample size while achieving the same level of confidence. This effectively shortens the testing cycle, greatly reduces testing costs, and improves testing efficiency, offering broad application prospects. The content of the book is novel, systematic, and closely linked to practical applications, reflecting the new theories, methods, and achievements in the field of electronic system testing technology in recent years. It has a high academic level and practical value. This book can serve as a reference for technical personnel in the fields of data processing, test evaluation, test design, and statistical decision-making for electronic systems or electronic countermeasure systems. It can also be used as a reference for undergraduate and graduate students in universities and colleges when conducting research on related topics or studying courses.