Launch site metrology and testing technology

Author: Liu Yanjun (Compiler)
Publisher:
Publish Date: 2006-12-01
Features: This book is based on the characteristics of launch site metrology and systematically introduces the basic aspects of launch site metrology, launch site metrology management, the fundamentals of launch site metrology, metrology quality assurance, measurement uncertainty, basic parameters of launch site metrology, electromagnetic compatibility measurement, grounding resistance measurement, and metrology support for launch site test equipment. This book can serve as a training textbook or reference book for equipment management personnel, metrology management personnel, and metrology technicians in launch sites. It is also suitable for researchers and engineering technicians as a technical reference book. The book systematically introduces the basic aspects of launch site metrology, launch site metrology management, the fundamentals of launch site metrology, metrology quality assurance, measurement uncertainty, basic parameters of launch site metrology, electromagnetic compatibility measurement, grounding resistance measurement, and metrology support for launch site test equipment.