Electronic System Test Principles

Author: (USA) Mridha, (USA) Zorian, translated by Zhang Wei, Wang Zhong
Publisher:
Publish Date: 2007-01-01
Features: With the continuous development of electronic technology, electronic system testing faces increasingly significant challenges: researching more precise fault models, checking testability at the high-level design, and embedding more effective test structures during synthesis. This book provides a detailed introduction to the fundamental principles of testing and many essential basic knowledge to address these challenges. It covers practical design and testing knowledge for developing reliable electronic products, explains the main methods for design verification, and helps with testability checks. It explores how testing can be applied to random logic, memory, FPGA, and microprocessors. Finally, it offers advanced testing solutions for deep submicron designs. Readers can gain a deep understanding of the fundamental principles of testing and master numerous solutions through this book. The main contents of the book include:
● Explains the role of testing in design.
● Discusses the sequencing of scan paths and scan chains in detail.
● BIST solutions for embedded logic and memory blocks.
● Testing methods for FPGA.
● Testing of chip systems.