Statistical Process Control and Evaluation -- CPK, SPC, and PPM Technologies

Author: Jia Xin Zhang
Publisher:
Publish Date: 2004-08-01
Features: This book serves as a training textbook for electronic component quality and reliability technology. It is a practical reference for technical personnel and managers engaged in quality and reliability work. Additionally, it can be used as a textbook for senior undergraduate and graduate students in relevant fields such as electronic science and technology, microelectronics, applied physics, electronic engineering, and materials science at universities. It is also suitable for scientists, engineers, and university faculty in related fields. This book is part of the "Electronic Component Quality and Reliability Technology" series, introducing how to implement statistical quality control in electronic component production processes. It covers the necessity, basic concepts, and methods of SPC, CPK, and PPM technologies, as well as special issues and solutions that arise when applying SPC and CPK techniques to component production processes. The focus is on helping readers master how to solve practical problems in real-world applications.