Author: (USA) Dudney/B. et al. / Su Jinguo et al.
Publisher:
Publish Date: 2006-01-01
Features: Nowadays, many published software contain numerous bugs and perform poorly. Unfortunately, it is often difficult to accurately identify where the problems lie and what needs to be done to improve the situation. This book offers readers a fresh perspective on J2EE, providing numerous tools to identify and correct anti-patterns (i.e., poor coding and design habits). The authors analyze common mistakes made when developing J2EE applications and clearly outline how to refactor to overcome these challenges. For each anti-pattern, the authors provide practical examples and code, along with at least one refactoring solution. Readers can use these solutions to easily write better-performing, faster J2EE programs. The book covers over 50 J2EE anti-patterns, addressing many hot topics in Java programming: miscalculating bandwidth requirements; excessive data in JSP sessions; common functionality in every servlet; target overload in message-driven beans; and inappropriate selection of J2EE service layers. A pattern is a formal template describing good practices, while an anti-pattern uses the same form to describe inappropriate practices. This book not only identifies many anti-patterns in J2EE development, along with their symptoms and consequences, but also analyzes their causes and provides at least one refactoring solution to guide developers in gradually transforming code implementations into better designs. The purpose of this book is not to instruct developers on how to complete J2EE design and development, but to help readers become better J2EE developers by highlighting common mistakes in application development and showing how to fix them.
J2EE Anti-pattern
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