Approach to Effective Control of Processes Near Zero Defects: A Path to Achieving Six Sigma Quality

Author: Sun Jing
Publisher:
Publish Date: 2005-09-01
Features: This book introduces new research findings on the near-zero defect process. The quality control theory of the near-zero defect process was hailed by senior experts in China's quality field as the only new technology in Six Sigma. This theory provides a path to achieving Six Sigma quality levels. The book explores the characteristics of management and quality management in the internet era, delves into the concepts of narrow and broad Six Sigma, presents the origin and development stages of the near-zero defect process concept, examines the quality control theory system of the near-zero defect process, and offers a path to achieving Six Sigma quality. This is a reference book for improving on-site quality control and quality management levels. It provides tools and methods for on-site quality control for quality workers and process technicians, and serves as a textbook for upper-level undergraduate and graduate students engaged in quality research on statistical process control.