Electronic component reliability test engineering

Author: Luo Wen / Wei Jianzhong / Yang Hui, etc.
Publisher:
Publish Date: 2005-03-01
Features: This book includes the main categories of electronic component reliability tests: environmental tests (including 13 types of environmental and combined environmental tests); life tests and accelerated life tests; qualification tests; extreme stress tests; reliability screening tests; reliability growth tests. Each test category includes principles, theoretical models, test design, implementation procedures, equipment requirements, key technologies, and test examples. It also introduces related reliability fundamentals and statistical methods, provides component failure analysis and destructive physical analysis methods, procedures, and key technologies, as well as component failure prediction techniques in use. This book can serve as a reference for university professors, graduate and undergraduate students, and engineering technicians engaged in reliability research.