Modern X-ray Single Crystal Diffraction: Experimental Techniques and Data Analysis: Experimental Techniques and Data Analysis

Author: Ma Li
Publisher:
Publish Date: 2004-09-01
Features: This book is available for researchers engaged in crystal structure studies, X-ray diffraction analysis, and students and professionals in related fields for learning and reference. This book introduces the recent developments in X-ray polycrystal diffraction, focusing on experimental techniques and data analysis. The experimental techniques include X-ray sources (conventional laboratory sources and synchrotron radiation sources), detectors (various point, linear, and area detectors), optical elements (monochromators, focusing elements, and collimators), as well as the application of computers (data processing, databases, and websites). It also introduces various diffraction geometries, their characteristics, and applicable ranges. The data analysis emphasizes the full-pattern fitting developed from Rietveld refinement, covering its basic principles, experimental requirements, refinement strategies, and providing a detailed description of its principles and application examples in the analysis of polycrystalline aggregate structures, refinement, and structure determination from scratch, as well as the analysis of microstructures within crystals. Additionally, it introduces methods for correcting experimental data and assessing instrument performance.