Reliability Physics

Author: Yao Lizhen
Publisher:
Publish Date: 2004-08-01
Features: This book is one of the series "Electronic Component Quality and Reliability Technology," which comprehensively discusses and introduces the fundamental knowledge of reliability physics and failure analysis techniques for electronic components. The book is divided into four parts.
1. It elaborates on the theoretical foundation in electronic component failure analysis, including atomic physics, materials science, chemistry, metallurgy, and the basic operating principles of components. It also introduces manufacturing processes and technologies related to component failure.
2. It discusses physical models of failure, introduces failure analysis procedures, common failure analysis methods and techniques, as well as advanced microanalysis technologies used for failure analysis.
3. It analyzes failure modes and mechanisms of specific components, including microelectronics, resistors and capacitors, relays and connectors, optoelectronic devices, and vacuum electronic devices, as well as the failure modes and mechanisms of component leads and electrode systems, proposing measures to improve the reliability of electronic components.
4. It explains the principles of electrostatic discharge failure and its protection, as well as the radiation effects of components and radiation hardening techniques.
This book is intended for science and technology personnel, managers, quality and reliability professionals involved in the research, production, and use of various electronic components for learning and reference. It can also be used as a teaching material for students and teachers in related fields such as electronics, electrical engineering, optoelectronics, vacuum electronics, materials, and information at universities and colleges.