Digital system testing and testability design

Author: Abramovich
Publisher:
Publish Date: 2004-01-01
Features: Digital Systems Testing and Testable Design is an outstanding textbook for undergraduate and graduate students in the United States. It systematically introduces the theory and methods of structural testing, the theory and metrics of testable design, the theory and methods of test data processing and simplification, as well as the theory and methods of testing intelligent chips (such as processors, digital signal processors, and automata, etc.). The book consists of 15 chapters, divided into three parts. The first eight chapters are Part I, which primarily introduces digital systems, the sources of defects in digital microsystem chips, methods of logical description—fault modeling, fault simulation, testing stuck-at faults, testing bridged faults, functional testing of intelligent digital systems, and its scope. Chapters 9 to 14 are Part II, which mainly covers the theory and methods of testable design for digital systems, as well as modern testing theories and methods such as built-in self-test (BIST) test data compression. Chapter 15 is Part III, which primarily discusses the methods of system testing. The book features clear concepts, well-structured layers, accurate definitions and proofs, concise algorithm derivation and explanations. Each chapter includes numerous exercises to help readers digest and absorb the concepts.