Author: [USA] Alfred L. Crou
Publisher:
Publish Date: 2006-06-01
Features: This book discusses the testing techniques for integrated circuits and embedded digital systems, proposing many important and critical solutions. It addresses practical issues encountered in testing from the perspective of technical and product investment costs, focusing on the testing of embedded cores and SoCs.
Test Design for Digital Integrated Circuits and Embedded Core Systems
📌 Related Posts
Literature
Founder Book Version 9.01 Application Training Course
2026-09-23
Literature
God's Land, Desolate City, Fortress, Temple, Palace
2026-09-27
Literature
Investment and Appraisal of Chinese Artworks Series - Ming Dynasty Porcelain
2026-09-28
Literature
Automotive body repair technology
2026-10-05
Literature
UG NX 3.0 Chinese Version Mechanical Design Example Analysis
2026-10-07
Literature
Practical Software Engineering
2026-10-07
Literature
Software Testing (English Version, 2nd Edition)
2026-10-07
Literature
Differential Geometry and Its Applications (English Edition. 2nd Edition)
2026-10-07