Digital System Testing and Testable Design

Author: Abramovici
Publisher:
Publish Date: 2006-08-01
Features: This book systematically introduces the theory and methods of digital system testing, including test generation, fault models, fault simulation, testability design, and built-in self-testing (BIST). The book is divided into three parts: Part one introduces the sources of defects in digital systems and digital microsystem chips, as well as methods of logical description; Part two covers the theory and methods of testability design for digital systems, built-in self-testing (BIST), and test data compression methods; Part three primarily discusses system testing methods. The book is clear in concept, well-structured, with accurate definitions and proofs, and concise algorithm derivation and explanations. Each chapter includes numerous exercises to help readers digest and absorb the concepts learned. This book can serve as a reference for technical personnel related to digital system design and can also be used as a textbook for senior undergraduate or graduate students in relevant fields at universities.