Modern Integrated Circuit Test Technology

Author: None
Publisher:
Publish Date: 2006-05-01
Features: The book is divided into two parts. The first part mainly introduces digital VLSI structured testing methods, mixed-signal circuit testing methods, design verification techniques, and integrated circuit testing standards. The second part focuses on digital/analog/mixed-signal integrated circuit testing systems and integrated circuit testing verification systems, with special attention paid to the development of new categories of testing systems characterized by SOC testing, DFT-based testing, and RAM testing, as well as standard bus-based integrated circuit testing systems. This book can serve as a learning and training textbook for researchers, technicians, and management personnel preparing to enter the field of microelectronics testing and design, as well as a teaching and reference material for students and faculty in related disciplines at universities. The book is divided into two parts based on integrated circuit testing principles and testing equipment. In line with the development of modern integrated circuit testing technology and professional testing needs, the first part mainly introduces digital VLSI structured testing methods, mixed-signal circuit testing methods, design verification techniques, and integrated circuit testing standards. The second part focuses on digital/analog/mixed-signal integrated circuit testing systems and integrated circuit testing verification systems, while paying special attention to the development of new categories of testing systems characterized by SOC testing, DFT-based testing, and RAM testing, as well as standard bus-based integrated circuit testing systems. It also includes two special topics: testing system metrology and automatic sorting machines/probe test stations. This book can serve as a learning and training textbook for researchers, technicians, and management personnel engaged in microelectronics testing and design, as well as a teaching and reference material for students and faculty in related disciplines at universities. The book is divided into two parts. The first part mainly introduces digital VLSI structured testing methods, mixed-signal circuit testing methods, design verification techniques, and integrated circuit testing standards. The second part focuses on digital/analog/mixed-signal integrated circuit testing systems and integrated circuit testing verification systems.