Scanning Electron Microscopy Technology and Its Applications

Author: Guo Suzhi
Publisher:
Publish Date: 2006-02-01
Features: The observation of scanning electron microscopy (SEM) is provided in the form of secondary electron images or photographs. Whether the obtained images can truthfully reflect the microstructural morphology of the actual sample being studied depends on many factors, including the functionality of the instrument and the settings of the observation conditions. More importantly, the sample preparation technique is a critical factor. Inappropriate sample preparation methods often lead to unsatisfactory research results, sometimes even halting further work. Therefore, during the writing process, the author provides necessary introductions to sample preparation methods, testing conditions, and the fundamental principles, methods, and observation condition settings required for interpreting and analyzing results, in order to enable readers to correctly select and apply these techniques to solve various problems encountered in research. This book is based on the author's extensive practical experience in SEM technology and sample preparation techniques, combined with the latest advancements in SEM technology, typical application examples, and lecture notes used when teaching "Biological Electron Microscopy Technology" and "Instrumental Analysis" courses, specifically the section on "Scanning Electron Microscopy Technology and Its Applications." The author believes that the publication of this book can provide researchers applying SEM technology with a practical reference, as well as serve as a reference for teaching and research personnel in various disciplines. Additionally, this book can also be used as a textbook for graduate and undergraduate students.