Textbook for the 21st Century Curriculum - Material Analysis Methods (2nd Edition)

Author: Zhou Yu
Publisher:
Publish Date: 2006-01-01
Features: This book mainly includes two parts: X-ray diffraction analysis and electron microscopy analysis. It introduces the principles, equipment, and experimental methods for analyzing the microstructure of materials using X-ray diffraction and electron microscopic techniques. The content includes: X-ray diffraction direction and intensity, polycrystal analysis methods and X-ray diffraction instruments, phase analysis, macroscopic stress measurement, polycrystal texture determination, transmission electron microscopy structure and principles, electron diffraction, diffraction contrast imaging, diffraction dynamics, high-resolution transmission electron microscopy, scanning electron microscopy structure and principles, electron probe microanalysis, etc. Additionally, it briefly introduces ion probes, low-energy electron diffraction, Auger electron spectroscopy, field ion microscopy, atomic probe scanning tunneling microscopy, atomic force microscopy, and X-ray photoelectron spectroscopy. The book emphasizes the introduction of new achievements in the analysis of material microstructure. This book can serve as a textbook or teaching reference for undergraduate and graduate students in the fields of materials science and engineering, as well as for faculty and technicians engaged in material research and analysis testing in other disciplines such as material forming and control engineering.