Introduction to Scanning Tunneling Microscopy

Author: Chen Chengjun
Publisher:
Publish Date: 1996-12-01
Features: This book is the first of its kind internationally on scanning tunneling microscopy, covering the history and overview of scanning tunneling microscopy, imaging principles, instruments and components, as well as scanning tunneling spectroscopy, atomic force microscopy, and several application examples. The content is rich, detailed, and easy to understand, with unique insights. It can serve as a textbook for relevant majors in higher education institutions and as a reference for researchers in fields such as surface science, thin film physics, mesoscopic physics, electrochemistry, microelectronics, and molecular biology.