Author: Mei Wenhua
Publisher:
Publish Date: 2003-05-01
Features: Reliability growth testing is a formal process conducted under real or simulated environmental conditions to expose and identify systematic failure modes and mechanisms in products. By implementing corrective measures to prevent the recurrence of failure modes, the reliability of the product is improved. Investing in reliability growth testing can significantly reduce maintenance costs throughout the product's lifecycle. This book introduces the relevant knowledge of reliability growth testing. The book is divided into 7 chapters: 1. Overview of Reliability Growth; 2. Reliability Growth Testing; 3. Duane Model; 4. AMSAA Model; 5. AMSAA Model for Multiple Products; 6. Gompertz Model and Its Improvements; 7. Reliability Growth Engineering for Electronic Products. The content of the book is both in-depth and accessible, striving to combine theoretical derivations with engineering applications. It offers innovative insights in the evaluation methods of reliability growth testing for multiple identical products, providing a scientific theoretical basis for reasonably assessing product reliability levels and holding significant engineering application value. Some research findings have been adopted by international standards such as IEC61014, IEC61124, and IEC61164. This book is suitable for management personnel and engineering technicians in equipment management agencies and departments involved in validation, development, production, and testing. It can also serve as a teaching reference for relevant majors in higher education institutions.
Reliability Growth Test
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