Author: Wang Yueke
Publisher:
Publish Date: 2003-03-01
Features: This book comprehensively and systematically discusses modern dynamic testing techniques and the theoretical and practical applications in dynamic testing. It introduces modern high-tech applications such as modern sensor technology, microelectronics technology, computer technology, and information processing technology in dynamic testing. The book consists of 8 chapters, covering an introduction to modern dynamic testing techniques, mathematical models and modeling methods of testing systems, dynamic characteristics analysis and dynamic performance index testing of testing systems, modern new sensor technology, data acquisition technology, computer-aided testing, testing signal analysis and processing technology, and dynamic error correction and dynamic compensation. This book can serve as a graduate textbook for majors such as testing and measurement technology, instrumentation, and automatic control, and can also be used by senior undergraduate students in related fields and reference for scientific and technical workers.
Modern Dynamic Testing Technology
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