Based on chaos and wavelet fault information diagnosis

Author: Jiang Wanlu
Publisher:
Publish Date: 2005-08-01
Features: This book discusses new theories, methods, and experiences in fault information diagnosis under strong interference backgrounds, based on chaos theory and multi-resolution analysis theory. It first systematically elaborates on the research status and development trends of fault diagnosis technology. After summarizing the fundamental issues of chaos theory and detailing various chaos identification methods in engineering, the subharmonic Melnikov method is used to derive the existence of subharmonic outer orbits in the Duffing oscillator, explaining the intermittent chaos mechanism of the Duffing oscillator. The principle of using the intermittent chaos phenomenon of this oscillator for weak fault information diagnosis under strong noise backgrounds is proposed.
Next, the excellent zooming performance of wavelet transform in time-frequency localization is analyzed, and the frequency band splitting capability of orthogonal wavelets is elaborated. The "high-frequency low-resolution" flaw of orthogonal multi-resolution analysis is pointed out. By analyzing the frequency band splitting capability of orthogonal wavelet packet analysis, it is demonstrated that orthogonal wavelet packet analysis can overcome the shortcomings of orthogonal wavelet transform, and a chaos identification method based on orthogonal wavelet packet analysis is proposed. Additionally, the propagation characteristics of singular points and random noise in the modulus maxima of wavelet transform are explained, as well as methods for suppressing or attenuating certain frequency intervals of the signal. The book defines several different aspects of wavelet analysis in fault diagnosis, from theory to practical applications.
Through diagnostic examples, the intermittent chaos fault diagnosis method, the wavelet-based fault diagnosis method, and traditional fault diagnosis methods are compared, highlighting the advantages of the new theoretical methods. Finally, an industrial fault diagnosis system is introduced. The book presents novel theories, combines principles with methods, features rich examples, and is highly practical, reflecting the latest developments in the field of fault information diagnosis. It is suitable for engineers and technicians engaged in equipment condition monitoring and fault diagnosis, as well as for use as a textbook or reference book for graduate students in related fields.