Material analysis methods

Author: Zhou Yu
Publisher:
Publish Date: 2000-05-01
Features: This book mainly includes two parts: X-ray diffraction analysis and electron microscopic analysis. It introduces the principles, equipment, and experimental methods for analyzing the microstructure and composition of materials using X-ray diffraction and electron microscopic techniques. The content includes: X-ray diffraction direction and intensity, polycrystal analysis methods and X-ray diffraction instruments, phase analysis, macroscopic stress measurement, polycrystal structure determination, transmission electron microscopy structure and principles, electron diffraction, diffraction contrast imaging, diffraction dynamics, high-resolution transmission electron microscopy, scanning electron microscopy structure and principles, electron probe microanalysis, and more. Additionally, it briefly introduces microanalytical methods such as ion probes, low-energy electron diffraction, Auger electron spectroscopy, field ion microscopy, atomic probe scanning tunneling microscopy, atomic force microscopy, and X-ray photoelectron spectroscopy, along with experimental guidance. The case studies in the book emphasize the introduction of new achievements in the analysis of material microstructure and composition. This book can serve as a textbook or teaching reference for undergraduate and graduate students in the fields of materials science and engineering, as well as for faculty and technicians from other disciplines such as materials forming and control engineering who are engaged in material research and analysis.