Materials Research Methods

Author: Tan Yuxu Hu Zhizhong
Publisher:
Publish Date: 2004-06-01
Features: This book includes three aspects of content, narrated in three parts. The first part is on optical metallography, covering conventional metallographic analysis, polarized light metallography, interference microscopy, phase contrast metallography, and quantitative metallography. The second part is on X-ray diffraction analysis, covering the properties and diffraction principles of X-rays, X-ray intensity, polycrystal analysis, phase analysis, macroscopic stress measurement, and single crystal orientation determination. The third part is on electron microscopy, covering transmission electron microscopy, electron diffraction, electron microscopy of thin crystals, scanning electron microscopy, and electron probe. This book can serve as a textbook for students majoring in materials science and engineering, as well as for those in mechanical and thermal processing. It can also be used as a reference for engineering technicians engaged in material engineering and mechanical manufacturing.