Author: Shi Donglong
Publisher:
Publish Date: 2002-12-01
Features: This book is the result of collaboration between experts and scholars in the field of functional thin films, both domestically and internationally. It is divided into nine chapters. It focuses on introducing the physical properties, structures, synthesis methods, phase diagrams, defect analysis, and their new applications of functional thin films. The content of the book includes the application of thin films in molecular sieves, new synthesis methods for ferroelectric thin films, new structures of nanoscale thin films, as well as fiber structures and emphasis in ceramics. The book provides a detailed introduction to new electron microscopy analysis methods, which are primarily established to address special structures and defects found in new materials. The final chapter introduces computer numerical simulation of thin film structures, focusing on the characteristics of the finite element method and boundary element method, as well as their applications in certain special problems.
Functional films and functional materials: New concepts and new technologies: New concepts and new technologies
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